Multimode Atomic Force Microscopy


  • Mode operasi:Mode tutul, mode tutul
  • Range scan XY:20 * 20um, opsional 50 * 50um, 100 * 100um
  • Z scan rentang:2.5um, opsional 5um, 10um
  • Resolusi Scan:Horizontal 0.2nm, Vertikal 0.05nm
  • Spesifikasi

    1. Kepala deteksi laser lan tahap pemindaian sampel terintegrasi, struktur stabil banget, lan anti-gangguan kuwat

    2.Precision probe positioning device, laser spot alignment imbuhan gampang banget

    3.Single-axis drive sampel kanthi otomatis nyedhaki probe vertikal, supaya tip jarum jejeg scan sampel

    4. Cara pakan jarum cerdas saka deteksi otomatis keramik piezoelektrik sing dikontrol motor nglindhungi probe lan sampel

    5. Posisi optik otomatis, ora perlu fokus, pengamatan wektu nyata lan posisi area pemindaian sampel probe

    6.Spring suspension cara shockproof, prasaja lan praktis, efek shockproof apik

    7. Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time ngawasi lingkungan kerja

    8. Editor pangguna koreksi nonlinier scanner terpadu, karakterisasi nanometer lan akurasi pangukuran luwih apik tinimbang 98%

    Mode operasi mode tutul, mode tutul
    Mode opsional Gaya Gesekan/Lateral, Amplitudo/Fase, Gaya Magnetik/Elektrostatik
    kurva spektrum gaya Kurva gaya FZ, kurva RMS-Z
    Range scan XY 20 * 20um, opsional 50 * 50um, 100 * 100um
    Range scan Z 2.5um, opsional 5um, 10um
    Resolusi scan Horizontal 0.2nm, Vertikal 0.05nm
    Ukuran sampel Φ≤90mm, H≤20mm
    Sampel perjalanan panggung 15 * 15 mm
    Observasi optik 4X lensa objektif optik/resolusi 2.5um
    Kacepetan mindhai 0.6Hz-30Hz
    Sudut pindai 0-360°
    Lingkungan operasi Sistem operasi Windows XP/7/8/10
    Antarmuka Komunikasi USB2.0/3.0
    Desain sing nyerep kejut Spring Suspended / Metal Shielded Box

    应用_副本


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